Magnetization and magnetic anisotropy in Ni/Pd multilayer films

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We have investigated magnetization and magnetic anisotropy in Ni/Pd multilayer films, prepared by de magnetron sputtering at 7 mTorr Ar sputtering pressure. Interestingly, enhanced magnetization was found in this system, due to the polarization of Pd. Delicate in situ stress and ex situ magnetostriction measurements were performed to quantitatively determine the magnetoelastic contribution to the perpendicular magnetic anisotropy in this system. The magnetoelastic anisotropy varied from 2.8 x 10(5) to 4.2 x 10(5) erg/cm(3), which was found to be 50 - 75% of the maximum anisotropy energy.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
1999-09
Language
English
Article Type
Article; Proceedings Paper
Keywords

MAGNETOCRYSTALLINE ANISOTROPY; STRESS

Citation

IEEE TRANSACTIONS ON MAGNETICS, v.35, no.5, pp.3807 - 2

ISSN
0018-9464
URI
http://hdl.handle.net/10203/20297
Appears in Collection
RIMS Journal Papers
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