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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| PHOTOELECTRONIC EVALUATION OF ELECTRON RADIATION DAMAGE IN CDS CRYSTALS Lim, Ho Bin; BUBE, RH, JOURNAL OF APPLIED PHYSICS, v.39, no.6, pp.2908 - 2914, 1968 | |
| SQUARE-LOOP PROPERTIES OF MATERIALS IN SYSTEM NIFE2O4-FE3O4-MNFE2O4 Lim, Ho Bin; WICKHAM, DG, JOURNAL OF APPLIED PHYSICS, v.35, no.5, pp.1442 - 1445, 1964 |