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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Magnetic soft x-ray microscopy at 15 nm resolution probing nanoscale local magnetic hysteresis (invited) Kim, DH; Fischer, P; Chao, WL; Anderson, E; Im, MY; Shin, Sung-Chul; Choe, SB, JOURNAL OF APPLIED PHYSICS, v.99, pp.269 - 275, 2006-04 | |
Two-dimensional critical scaling behavior of Barkhausen avalanches (invited) Shin, Sung-Chul; Ryu, Kwang-Su; Kim, Dong-Hyun; Akinaga, Hiro, JOURNAL OF APPLIED PHYSICS, v.103, no.7, 2008-04 |
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