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Results 21-30 of 763 (Search time: 0.008 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
21
Application of Electron-Cyclotron-Resonance Plasma Thermal-Oxidation to Bottom Gate Polysilicon Thin-Film Transistors

j.i. han; Kim, Choong Ki; c.h. han, JAPANESE JOURNAL OF APPLIED PHYSICS, v.35, no.2B, pp.930 - 933, 1996-02

22
주파수도약 대역확산 다중접속 통신망에서의 최적접속제어

김직동; 김상우, 한국통신학회논문지, v.23, no.10, pp.2755 - 2763, 1998-10

23
Performance benefits of virtual path tunneling for control and management flows in the broadband ATM networks

Choi, JunKyun; Kim, Soo Hyung; Kim, Nam; Sohn, SW; Choi, MunKee, ETRI JOURNAL, v.21, no.4, pp.23 - 28, 1999-12

24
Measurement of carrier generation lifetime in SOI devices

Shin, Hyung-Cheol; Racanelli, M; Huang, WM; Foerstner, J; Hwang, T; Schroder, DK, SOLID-STATE ELECTRONICS, v.43, no.2, pp.349 - 353, 1999-02

25
Test of the rational expectations hypothesis in Korea - determinants of real GNP fluctuations in Korea

Min, Hong Ghi; McDonald, Judy, Journal of East and West Studies (Currently known as Global Economic Review), v.19, no.1, pp.69 - 83, 1990

26
Does a thin foreign exchange market lead to destabilizing capital-market speculation in the Asian Crisis countries?

Min, Hong Ghi; McDonald, Judith A., Policy Research Working PaperS, v.2056, pp.1 - 44, 1999

27
The Portfolio-Balance Model of Exchange Rates: Short-run behavior and Forecasting

Min, Hong Ghi; McDonaldb, Judy, INTERNATIONAL ECONOMIC JOURNAL, v.7, no.4, pp.75 - 87, 1993

28
Opening to Foreign Banks: Issues of Stability, Efficiency, and Growth

Demirgüç-Kunt, Asli; Levine, Ross; Min, Hong Ghi, The Implications of Globalization of World Financial Market, pp.83 - 105, 1998

29
How the Republic of Korea's financial structure affects the volatility of four asset prices

Min, Hong Ghi; Park, Jong-goo, Policy Research Working Papers, v.2327, pp.1 - 34, 1999-11

30
Defect creation in a-Si:H thin film transistors by bias-stress

Wi, BR; Lee, WH; Lee, C; Shin, Sung-Chul, JAPANESE JOURNAL OF APPLIED PHYSICS, v.36, no.5A, pp.536 - 539, 1997-05

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