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NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Soft X-ray resonant Kerr rotation measurement and simulation of element-resolved and interface-sensitive magnetization reversals in a NiFe/FeMn/Co trilayer structure Kim, SK; Lee, KS; Kortright, JB; Shin, Sung-Chul, APPLIED PHYSICS LETTERS, v.86, pp.87 - 95, 2005-03 | |
Experimental observation of magnetically dead layers in Ni/Pt multilayer films Kim, Sang-Koog; Jeong, JR; Kortright, JB; Shin, Sung-Chul, PHYSICAL REVIEW B, v.64, no.5, 2001-08 |
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