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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| IN-SITU STRESS MEASUREMENTS OF CO/PD MULTILAYER FILMS USING AN OPTICAL NONCONTACT DISPLACEMENT DETECTOR KIM, YS; Shin, Sung-Chul, THIN SOLID FILMS, v.258, no.1-2, pp.128 - 131, 1995-03 | |
| DEPOSITION AND ELECTRICAL CHARACTERIZATION OF VERY THIN SRTIO3 FILMS FOR ULTRA LARGE-SCALE INTEGRATED DYNAMIC RANDOM-ACCESS MEMORY APPLICATION HWANG, CS; PARK, SO; KANG, CS; CHO, HJ; KANG, HK; AHN, ST; LEE, MY, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.34, no.9B , pp.5178 - 5183, 1995-09 |
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