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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| IN-SITU STRESS MEASUREMENTS OF CO/PD MULTILAYER FILMS USING AN OPTICAL NONCONTACT DISPLACEMENT DETECTOR KIM, YS; Shin, Sung-Chul, THIN SOLID FILMS, v.258, no.1-2, pp.128 - 131, 1995-03 | |
| ORIGIN OF UNKNOWN X-RAY-DIFFRACTION PEAKS FROM INCOMMENSURATE SUPERLATTICES Kim, Sang-Koog; CHANG, CH; LEE, YP; KOO, YM, JOURNAL OF APPLIED PHYSICS, v.77, no.1, pp.423 - 425, 1995-01 |
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