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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Magnetic field dependence of spin reversal behavior in Co/Pd nanomultilayers Choe, SB; Shin, Sung-Chul, JOURNAL OF APPLIED PHYSICS, v.87, no.9, pp.5076 - 5078, 2000-05 | |
| Electric-field control of magnetic property in perpendicularly magnetized Co0.25Pd0.75/PMN-PT heterostructure Kim, Ji-Wan; Kim, Ju-Hyun; You, Chun-Yeol; Shin, Sung-Chul, CURRENT APPLIED PHYSICS, v.17, no.7, pp.940 - 944, 2017-07 | |
| IN-SITU STRESS MEASUREMENTS OF CO/PD MULTILAYER FILMS USING AN OPTICAL NONCONTACT DISPLACEMENT DETECTOR KIM, YS; Shin, Sung-Chul, THIN SOLID FILMS, v.258, no.1-2, pp.128 - 131, 1995-03 | |
| Local hysteresis variation of Co/Pd nanomultilayers Choe, SB; Jang, HJ; Shin, Sung-Chul, JOURNAL OF APPLIED PHYSICS, v.87, no.9, pp.6848 - 6850, 2000-05 | |
| Correlation between fractal dimension and reversal behavior of magnetic domain in Co/Pd nanomultilayers Kim, DH; Cho, YC; Choe, SB; Shin, Sung-Chul, APPLIED PHYSICS LETTERS, v.82, pp.3698 - 3700, 2003-05 | |
| EFFECTS OF SPUTTERING PRESSURE ON MAGNETIC AND MAGNETOOPTICAL PROPERTIES IN COMPOSITIONALLY MODULATED CO/PD THIN-FILMS Shin, Sung-Chul; KIM, JH; AHN, DH, JOURNAL OF APPLIED PHYSICS, v.69, no.8, pp.5664 - 5666, 1991-04 | |
| Effects of polarizer and analyzer imperfections in a magneto-optical Kerr spectrometer You, CY; Shin, Sung-Chul, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, v.17, no.6, pp.910 - 913, 2000-06 | |
| Derivation of simplified analytic formulae for magneto-optical Kerr effects You, CY; Shin, Sung-Chul, APPLIED PHYSICS LETTERS, v.69, no.9, pp.1315 - 1317, 1996-08 | |
| Direct observation of magnetization reversal behaviors in exchange-coupled NiO/Fe films Lee, Hun-Sung; Ryu, Kwang-Su; Jeon, Kun-Rok; Shin, Sung-Chul, JOURNAL OF APPLIED PHYSICS, v.107, no.9, 2010-05 | |
| In situ magnetoelastic coupling and stress-evolution studies of epitaxial Co35Pd65 alloy films in the monolayer regime Jeong, JR; Kim, J; Lee, JW; Kim, SK; Shin, Sung-Chul, APPLIED PHYSICS LETTERS, v.79, no.20, pp.3296 - 3298, 2001-11 |
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