Browse "RIMS Journal Papers" by Subject reliability
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| Effects of Bottom Polysilicon Doping on the Reliability of Interpoly Oxide Grown by Using Electron Cyclotron Resonance N2O-Plasma N-I Lee; J-W Lee; S-H Hur; H-S Kim; C-H Han, JAPANESE JOURNAL OF APPLIED PHYSICS, v.37, no.3B, pp.1125 - 1128, 1998-01 |
| Stability Improvement of In-Sn-Ga-O Thin-Film Transistors at Low Annealing Temperatures Jeong, Hyun-Jun; Ok, Kyung-Chul; Park, Jozeph; Lim, Junhyung; Cho, Johann; Park, Jin-Seong, IEEE ELECTRON DEVICE LETTERS, v.36, no.11, pp.1160 - 1162, 2015-11 |
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