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Browse "RIMS Journal Papers" by Subject memory chips

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1	Single event upset measurements of memory chips for the Langmuir probe on STSAT-2 Ryu, Kwangsun; Shin, Goo-Hwan; Kim, Hyung-Myung; Kim, Heejoon; Min, KyoungWook, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.52, pp.853 - 857, 2008-03

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