Browse "RIMS Journal Papers" by Subject RELIABILITY
Showing results 1 to 5 of 5
| Effect of Rubric Rating Scale on the Evaluation of Engineering Design Projects Thompson, Mary Kathryn; Clemmensen, Line Harder; Ahn, Beung-uk, INTERNATIONAL JOURNAL OF ENGINEERING EDUCATION, v.29, no.6, pp.1490 - 1502, 2013 |
| EFFECT OF THE SILICIDATION REACTION CONDITION ON THE GATE OXIDE INTEGRITY IN TI-POLYCIDE GATE LEE, NI; KIM, YW; AHN, ST, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.33, no.1B, pp.672 - 677, 1994-01 |
| Monitoring Plasma Induced-Damage in Thin Oxide H. Shin; C. Hu, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.6, no.2, pp.96 - 102, 1993-05 |
| Optimal design of PZT-based piezoelectric energy harvesting module for availability Park, Sanghyun; Hong, Seong Kwang; Lee, Tae Hee; Kang, Kwangu; Cho, Su-gil, JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.33, no.3, pp.1211 - 1218, 2019-03 |
| Quantitative analysis of the mechanical robustness of multilayered bonding pad on a semiconductor device by nanoindentation and nanoscratch tests Shin, Dong Kil; Im, Jay, THIN SOLID FILMS, v.531, pp.340 - 348, 2013-03 |
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