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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Journal Papers(저널논문)

Interfacial Trap Density-of-States in Pentacene- and ZnO-Based Thin-Film Transistors Measured via Novel Photo-excited Charge-Collection Spectroscopy

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dc.contributor.authorLee, Kimoonko
dc.contributor.authorOh, Min Sukko
dc.contributor.authorMun, Sung-jinko
dc.contributor.authorLee, Kwang H.ko
dc.contributor.authorHa, Tae Wooko
dc.contributor.authorKim, Jae Hoonko
dc.contributor.authorPark, Sang-Hee Koko
dc.contributor.authorHwang, Chi-Sunko
dc.contributor.authorLee, Byoung H.ko
dc.contributor.authorSung, Myung M.ko
dc.contributor.authorIm, Seongilko
dc.date.accessioned2015-11-20T12:49:50Z-
dc.date.available2015-11-20T12:49:50Z-
dc.date.created2014-04-17-
dc.date.created2014-04-17-
dc.date.issued2010-08-
dc.identifier.citationADVANCED MATERIALS, v.22, no.30, pp.3260 - 3260-
dc.identifier.issn0935-9648-
dc.identifier.urihttp://hdl.handle.net/10203/201721-
dc.description.abstractDirect quantitative mapping of the density-of-states, named the photo-excited charge-collection technique, for the interface traps at the n-ZnO and/or p-pentacene thin-film transistor channel is implemented by using monochromatic photons which are carried by optical fibers and are probed onto thin-film transistors. [GRAPHICS] .-
dc.languageEnglish-
dc.publisherWILEY-V C H VERLAG GMBH-
dc.titleInterfacial Trap Density-of-States in Pentacene- and ZnO-Based Thin-Film Transistors Measured via Novel Photo-excited Charge-Collection Spectroscopy-
dc.typeArticle-
dc.identifier.wosid000281328500006-
dc.identifier.scopusid2-s2.0-77955399765-
dc.type.rimsART-
dc.citation.volume22-
dc.citation.issue30-
dc.citation.beginningpage3260-
dc.citation.endingpage3260-
dc.citation.publicationnameADVANCED MATERIALS-
dc.identifier.doi10.1002/adma.201000722-
dc.contributor.localauthorPark, Sang-Hee Ko-
dc.contributor.nonIdAuthorLee, Kimoon-
dc.contributor.nonIdAuthorOh, Min Suk-
dc.contributor.nonIdAuthorMun, Sung-jin-
dc.contributor.nonIdAuthorLee, Kwang H.-
dc.contributor.nonIdAuthorHa, Tae Woo-
dc.contributor.nonIdAuthorKim, Jae Hoon-
dc.contributor.nonIdAuthorHwang, Chi-Sun-
dc.contributor.nonIdAuthorLee, Byoung H.-
dc.contributor.nonIdAuthorSung, Myung M.-
dc.contributor.nonIdAuthorIm, Seongil-
dc.type.journalArticleArticle-
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