Electronic properties of the Cu2ZnSn(Se,S)(4) absorber layer in solar cells as revealed by admittance spectroscopy and related methods

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dc.contributor.authorGunawan, Okiko
dc.contributor.authorGokmen, Tayfunko
dc.contributor.authorWarren, Charles W.ko
dc.contributor.authorCohen, J. Davidko
dc.contributor.authorTodorov, Teodor K.ko
dc.contributor.authorBarkhouse, D. Aaron R.ko
dc.contributor.authorBag, Santanuko
dc.contributor.authorTang, Jiangko
dc.contributor.authorShin, Byunghako
dc.contributor.authorMitzi, David B.ko
dc.date.accessioned2015-11-20T12:43:12Z-
dc.date.available2015-11-20T12:43:12Z-
dc.date.created2014-04-17-
dc.date.created2014-04-17-
dc.date.created2014-04-17-
dc.date.issued2012-06-
dc.identifier.citationAPPLIED PHYSICS LETTERS, v.100, no.25-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10203/201659-
dc.description.abstractAdmittance spectra and drive-level-capacitance profiles of several high performance Cu2ZnSn(Se,S)(4) (CZTSSe) solar cells with bandgap similar to 1.0-1.5 eV are reported. In contrast to the case for Cu(In,Ga)(S,Se)(2), the CZTSSe capacitance spectra exhibit a dielectric freeze out to the geometric capacitance plateau at moderately low frequencies and intermediate temperatures (120-200 K). These spectra reveal important information regarding the bulk properties of the CZTSSe films, such as the dielectric constant and a dominant acceptor with energy level of 0.13-0.2 eV depending on the bandgap. This deep acceptor leads to a carrier freeze out effect that quenches the CZTSSe fill factor and efficiency at low temperatures. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4729751]-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.subjectEFFICIENCY-
dc.titleElectronic properties of the Cu2ZnSn(Se,S)(4) absorber layer in solar cells as revealed by admittance spectroscopy and related methods-
dc.typeArticle-
dc.identifier.wosid000305676400105-
dc.identifier.scopusid2-s2.0-84863324703-
dc.type.rimsART-
dc.citation.volume100-
dc.citation.issue25-
dc.citation.publicationnameAPPLIED PHYSICS LETTERS-
dc.identifier.doi10.1063/1.4729751-
dc.contributor.localauthorShin, Byungha-
dc.contributor.nonIdAuthorGunawan, Oki-
dc.contributor.nonIdAuthorGokmen, Tayfun-
dc.contributor.nonIdAuthorWarren, Charles W.-
dc.contributor.nonIdAuthorCohen, J. David-
dc.contributor.nonIdAuthorTodorov, Teodor K.-
dc.contributor.nonIdAuthorBarkhouse, D. Aaron R.-
dc.contributor.nonIdAuthorBag, Santanu-
dc.contributor.nonIdAuthorTang, Jiang-
dc.contributor.nonIdAuthorMitzi, David B.-
dc.type.journalArticleArticle-
dc.subject.keywordPlusEFFICIENCY-
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