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Electrosynthesis of CZTS films by sulfurization of CZT precursor: Effect of soft annealing treatment

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dc.contributor.authorGurav, S. V.ko
dc.contributor.authorPawar, S. M.ko
dc.contributor.authorShin, Seung Wookko
dc.contributor.authorSuryawanshi, M. P.ko
dc.contributor.authorAgawane, G. L.ko
dc.contributor.authorPatil, P. S.ko
dc.contributor.authorMoon, Jong-Hako
dc.contributor.authorYun, J. H.ko
dc.contributor.authorKim, Jin Hyeokko
dc.date.accessioned2015-11-20T10:19:04Z-
dc.date.available2015-11-20T10:19:04Z-
dc.date.created2013-09-30-
dc.date.created2013-09-30-
dc.date.issued2013-10-
dc.identifier.citationAPPLIED SURFACE SCIENCE, v.283, pp.74 - 80-
dc.identifier.issn0169-4332-
dc.identifier.urihttp://hdl.handle.net/10203/201319-
dc.description.abstractIn the present work, CZTS thin films have been prepared by sulfurization of electrodeposited Cu-Zn-Sn (CZT) precursor. Prior to sulfurization, as-deposited CZT precursors have been soft annealed in Ar atmosphere at different temperatures (250-350 degrees C). The structural, morphological, compositional and optical properties of the films have been investigated in detail. It is found that, soft annealing temperature has a significant impact on the properties of CZTS thin films. The systematic study on the improvement in the properties of CZTS films using soft annealing route has been studied and discussed. (C) 2013 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectCU2ZNSNS4 THIN-FILMS-
dc.subjectZN-SN PRECURSORS-
dc.subjectSOLAR-CELL-
dc.subjectELECTRODEPOSITION-
dc.subjectCRYSTALLIZATION-
dc.subjectTEMPERATURE-
dc.subjectFABRICATION-
dc.subjectINTERFACE-
dc.subjectABSORBER-
dc.subjectFACILE-
dc.titleElectrosynthesis of CZTS films by sulfurization of CZT precursor: Effect of soft annealing treatment-
dc.typeArticle-
dc.identifier.wosid000323601700012-
dc.identifier.scopusid2-s2.0-84883158362-
dc.type.rimsART-
dc.citation.volume283-
dc.citation.beginningpage74-
dc.citation.endingpage80-
dc.citation.publicationnameAPPLIED SURFACE SCIENCE-
dc.identifier.doi10.1016/j.apsusc.2013.06.024-
dc.contributor.nonIdAuthorGurav, S. V.-
dc.contributor.nonIdAuthorPawar, S. M.-
dc.contributor.nonIdAuthorSuryawanshi, M. P.-
dc.contributor.nonIdAuthorAgawane, G. L.-
dc.contributor.nonIdAuthorPatil, P. S.-
dc.contributor.nonIdAuthorMoon, Jong-Ha-
dc.contributor.nonIdAuthorYun, J. H.-
dc.contributor.nonIdAuthorKim, Jin Hyeok-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorCu2ZnSnS4 (CZTS) thin films-
dc.subject.keywordAuthorSoft annealing-
dc.subject.keywordAuthorElectrodeposition-
dc.subject.keywordAuthorCyclic voltammetry (CV)-
dc.subject.keywordAuthorX-ray diffraction-
dc.subject.keywordPlusCU2ZNSNS4 THIN-FILMS-
dc.subject.keywordPlusZN-SN PRECURSORS-
dc.subject.keywordPlusSOLAR-CELL-
dc.subject.keywordPlusELECTRODEPOSITION-
dc.subject.keywordPlusCRYSTALLIZATION-
dc.subject.keywordPlusTEMPERATURE-
dc.subject.keywordPlusFABRICATION-
dc.subject.keywordPlusINTERFACE-
dc.subject.keywordPlusABSORBER-
dc.subject.keywordPlusFACILE-
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