We have investigated the dependence of the surface anisotropy on the interfacial microstructure in Co/Pd and Co/Pt multilayers prepared by sputtering. The interfacial microstructure of multilayers was manipulated by changing sputtering Ar gas pressure in the preparation of samples. The surface anisotropy of Co/Pd and Co/Pt multilayers was sensitively dependent on the interfacial microstructural modification and the surface anisotropy of those multilayers was found to be logarithmically dependent on the integrated low-angle X-ray diffraction intensity.