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Showing results 1 to 8 of 8

1
A review of the relationship between microstructural features and (t)he stress-strain behavior of metals

Gracio, JJ; Barlat, F; Rauch, E; Yoon, Jeong Whan; Picu, RC, MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK, v.36, no.10, pp.572 - 577, 2005-10

2
Anomalous hardening in magnesium driven by a size-dependent transition in deformation modes

Sim, Gi-Dong; Kim, Gyuseok; Lavenstein, Steven; Hamza, Mohamed H.; Fan, Haidong; El-Awady, Jaafar A., ACTA MATERIALIA, v.144, pp.11 - 20, 2018-02

3
Cyclic fatigue crack growth and closure behaviour in alumina ceramics

Song, Ji Ho, FATIGUE & FRACTURE OF ENGINEERING MATERIALS & STRUCTURES, v.21, no.12, pp.1575 - 1587, 1998

4
Effects of stretching and cycling on the fatigue behavior of polymer-supported Ag thin films

Sim, Gidong; Lee, Yong Seok; Lee, Soon-Bok; Vlassak, Joost J., MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v.575, pp.86 - 93, 2013-07

5
Fundamentals of mode III fracture: A discrete dislocation simulation approach

Lee, Soon-Bok, FRACTURE AND STRENGTH OF SOLIDS, PTS 1 AND 2: PT 1: FRACTURE MECHANICS OF MATERIALS; PT 2: BEHAVIOR OF MATERIALS AND STRUCTURE BOOK SERIES: KEY ENGINEERING MATERIALS, v.145-9, pp.144 - 12, 1998

6
High-throughput membrane deflection characterization of shape memory alloy thin films

Lee, Zhuo Feng; Ryu, Hyemin; Kim, Ji-Young; Kim, Hojang; Choi, Jae-Hoon; Oh, Injong; Sim, Gi-Dong, MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v.892, 2024-02

7
Residual stress-driven test technique for freestanding ultrathin films: Elastic behavior and residual strain

Cuddalorepatta, Gayatri K.; Sim, Gi-Dong; Li, Han; Pantuso, Daniel; Vlassak, Joost J., JOURNAL OF MATERIALS RESEARCH, v.34, no.20, pp.3474 - 3482, 2019-10

8
Scratch to sensitize: scratch-induced sensitivity enhancement in semiconductor thin-film sensors

Lee, Geonhee; Choi, Min; Chae, Soo Sang; Jeong, Du Won; Choi, Won Jin; Ji, Seulgi; Kim, Yun Ho; et al, NANOSCALE, v.11, no.32, pp.15374 - 15381, 2019-08

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