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Browse "School of Mechanical and Aerospace Engineering(기계항공공학부)" by Author You J.

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Showing results 1 to 4 of 4

1
Angle-resolved reflectometer for thickness measurement of multi-layered thin-film structures

Joo W.-D.; You J.; Ghim Y.-S.; Kim, Seung-Woo, Interferometry XIV: Techniques and Analysis, 123, 2008-08-11

2
Continuous scanning phase measurement for high immunity to vibration

Park J.; You J.; Kim, Seung-Woo, Optical Inspection and Metrology for Non-Optics Industries, 123, 2009-08-03

3
Dispersive white-light interferometry for 3-D inspection of thin-film layers of flat panel displays

Ghim Y.-S.; You J.; Kim, Seung-Woo, Optical Measurement Systems for Industrial Inspection V, 123, 2007-06-18

4
Simultaneous measurements of thin-film thickness and refractive index by dispersive white-light interferometry

Ghim Y.-S.; You J.; Kim, Seung-Woo, Thin-Film Coatings for Optical Applications IV, pp.6674, 123, 2007-08-29

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