Showing results 1 to 2 of 2
Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometer You, JW; Kim, D; Ryu, SY; Kim, Soohyun, OPTICS EXPRESS, v.17, no.3, pp.1352 - 1360, 2009-02 |
White light on-axis digital holographic microscopy based on spectral phase shifting Kim, D; You, JW; Kim, Soohyun, OPTICS EXPRESS, v.14, no.1, pp.229 - 234, 2006-01 |
Discover