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Analysis of error and development of calibration's method to design precision rotating analyzer ellipsometer Gil, H.O.; Park, S.L.; Jung, J.W.; Gweon, Dae-Gab, SPIE/ISAM, pp.92 - 101, 2000-09 |
Tolerance analysis and compensation for focusing unit of near field recording system Lee, J.H.; Yoon, H.K.; Jung, J.W.; Oh, H.R.; Gweon, Dae-Gab, International symposium on optical, pp.111 - 113, 2002-07-08 |
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