Showing results 6 to 7 of 7
Semiconductor Multilayer Nanometrology with Machine Learning Kwak, Hyunsoo; Kim, Jungwon, Nanomanufacturing and Metrology, v.6, no.1, 2023-12 |
Towards highly specific measurement of binary mixtures by tandem operation of nanomechanical sensing system and micro-Raman spectroscopy Ko, Juhee; Lee, Bong Jae; Lee, Jungchul, SENSORS AND ACTUATORS B-CHEMICAL, v.367, 2022-09 |
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