Showing results 6 to 8 of 8
Semiconductor Multilayer Nanometrology with Machine Learning Kwak, Hyunsoo; Kim, Jungwon, Nanomanufacturing and Metrology, v.6, no.1, 2023-12 |
Study of Carrier Statistics in Uniaxially Strained Ge for a Low-Threshold Ge Laser Nam, Donguk; Sukhdeo, David S.; Gupta, Shashank; Kang, Ju-Hyung; Brongersma, Mark L.; Saraswat, Krishna C., IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, v.20, no.4, 2014-07 |
Towards highly specific measurement of binary mixtures by tandem operation of nanomechanical sensing system and micro-Raman spectroscopy Ko, Juhee; Lee, Bong Jae; Lee, Jungchul, SENSORS AND ACTUATORS B-CHEMICAL, v.367, 2022-09 |
Discover