Showing results 15881 to 15900 of 50978
Effects of the oxygen vacancy concentration in InGaZnO-Based RRAM = InGaZnO물질기반의 RRAM 소자에 산소 결핍 농도의 효과에 관한 연구link Kim, Moon-Seok; 김문석; et al, 한국과학기술원, 2013 |
Effects of the permittivity and permeability of a coating layer on waveguide long-slot antenna Park, Seong-Ook; Kim Byung Kwan, 10th Asia-Pacific Engineering Research Forum on Microwaves and Electromagnetic Theory, Fukuoka Institute of Technology, 2014-10-31 |
Effects of the Temperature on the Performance of Double-Gate Negative Capacitance Field-Effect Transistors Lee, Hyeon-Gu; Shin, Mincheol, NANO KOREA 2021, Korea Nanotechnology Research Society, 2021-07-07 |
Effects of the Thermal Annealing on Quarter Wavelength Reflectors in the ZnO-based Thin-Film SMR Devices Yoon, Giwan, 2003 Asia-Pacific Microwave Conference, pp.541 - 544, 2003-11 |
Effects of thermal annealing condition on N-incorporated ZnO films in FBAR devices Zhang, R.; Lee, Eunju; Yoon, Giwan, ELECTRONICS LETTERS, v.46, no.9, pp.605 - 606, 2010-04 |
Effects of thermal annealing Of W/SiO2 multilayer Bragg reflectors on resonance characteristics of film bulk acoustic resonator devices with cobalt electrodes Yim, Mun-Hyuk; Kim, Dong-Hyun; Chai, Dong-Kyu; Yoon, Gi-Wan, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.22, no.3, pp.465 - 471, 2004-05 |
Effects of thermal stress on the performance of benzocyclobutene-passivated In0.52Al0.48As/In0.53Ga0.47As high electron mobility transistors Yoon, M; Kim, T; Kim, D; Yang, Kyounghoon, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.43, pp.1910 - 1913, 2004-04 |
Effects of Thermal Treatment on the Characteristics of Spiral Inductors on Bragg Reflectors Linh Mai; Jae-young Lee; Minh-Tuan Le; Van-Su Pham; 윤기완, INTERNATIONAL JOURNAL OF MARITIME INFORMATION AND COMMUNICATION SCIENCES, v.4, no.4, pp.155 - 157, 2006-12 |
Effects of Thermal Treatments on Resonance Characteristics of FBAR Devices 윤기완; 송해일; Le, Minh Tuan; Pham, Van Su, 한국해양정보통신학회춘계학술대회, pp.376 - 380, 한국해양정보통신학회, 2005-05 |
Effects of Thick Bottom Electrode on ZnO-based FBAR Devices Yoon, Giwan; Lee, Jae-young; Linh, Mai; Pham, Van-Su; Kabir, S. M. Humayun, 한국해양정보통신학회 추계종합학술대회 , pp.211 - 214, 한국해양정보통신학회, 2007-10 |
Effects of Thin Dipole Layer in Silicon Tunnel Field Effect Transistors Lim, Yeongjun; Shin, Mincheol; Seo, Junbeom, IWCN2021, IWCN2021, 2021-05 |
Effects of Uniaxial Strain on Phosphorene Tunneling Field-Effect Transistors Seo, Junbeom; Shin, Mincheol; Jung, Sungwoo, IWCN2017, IWCN2017, 2017-06-08 |
Effects of unisolated optical sources on bidirectional SCM transmission systems Kim, H.; Woo, H.G.; Chung, Yun Chur, Optical Fiber Communication Conference, v.2, pp.369 - 371, 2000-03-07 |
Effects of various hydrogen-passivation techniques on the performance of a-SiC:H-based p-i-n-type thin-film visible-light-emitting diodes Lee, JW; Lim, Koeng-Su, JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, v.5, no.3, pp.229 - 233, 1997-01 |
Effects Of Various Sustain Electrode Gaps on the Discharge Characteristics of an AC PDP With an Auxiliary Electrode Choi, Chung-Sock; Lee, Sung-Min; Cho , Kwan-Hyun; Choi, Kyung-Cheol, IEEE TRANSACTIONS ON PLASMA SCIENCE, v.37, pp.2074 - 2081, 2009-10 |
Effects of virtual reality display types on the brain computer interface system Cho, H.S.; Park, K.S.; Kim, Y.; Kim, C.S.; Hahn, Minsoo, 4th International Conference on Universal Access in Human-Computer Interaction, UAHCI 2007, no.PART 2, pp.633 - 639, Springer Verlag (Germany), 2007-07-22 |
Effects of volatility of etch by-products on surface roughness during etching of metal gates in Cl-2 Hwang, Wan Sik; Cho, Byung Jin; Chan, Daniel S. H.; Lee, Sang Won; Yoo, Won Jong, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.155, no.1, pp.H6 - H10, 2008-01 |
Effects of VR Display Types on Brain Computer Interface Hahn, Minsoo; Cho, H; Park, K; Kim, Y; Kim, C; Lee, K, International Conference on Human-Computer Interaction 2007, pp.633 - 639, 2007 |
EFFECTS OF WINDOW OVERLAPPING ON INPUT OUTPUT INTERDEPENDENCIES IN MEDIAN FILTERS FAM, AT; Lee, Yong-Hoon, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, v.36, no.8, pp.1143 - 1146, 1989-08 |
The Effects of X-ray Irradiation-induced damage on Reliability in mos stuructures Kim, Shi-ho; Lee, Ho jun; Han, Chul-hi; Lee, Kwyro; Choi, Sang soo; Jeon, Young-jin; Fabrizio, Enzo Di; et al, Solid-State Electronics, 1994 |
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