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A 36.2 dB High SNR and PVT/Leakage-Robust eDRAM Computing-In-Memory Macro With Segmented BL and Reference Cell Array Ha, Sangwoo; Kim, Sangjin; Han, Donghyeon; Um, Soyeon; Yoo, Hoi-Jun, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.69, no.5, pp.2433 - 2437, 2022-05 |
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