Showing results 1 to 5 of 5
Gate-Induced Drain-Leakage (GIDL) Programming Method for Soft-Programming-Free Operation in Unified RAM (URAM) Han, Jin-Woo; Ryu, Seong-Wan; Choi, Sung-Jin; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.30, no.2, pp.189 - 191, 2009-02 |
Gate-to-Source/Drain Nonoverlap Device for Soft-Program Immune Unified RAM (URAM) Han, Jin-Woo; Kim, Chung-Jin; Choi, Sung-Jin; Kim, Dong-Hyun; Moon, Dong-Il; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.30, no.5, pp.544 - 546, 2009-05 |
Parasitic BJT Read Method for High-Performance Capacitorless 1T-DRAM Mode in Unified RAM Han, Jin-Woo; Moon, Dong-Il; Kim, Dong-H; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.30, no.10, pp.1108 - 1110, 2009-10 |
Partially depleted SONOs FinFET for unified RAM (URAM) - Unified function for high-speed 1T DRAM and nonvolatile memory Han, Jin-Woo; Ryu, Seong-Wan; Kim, Chung-Jin; Kim, Sung-Ho; Im, Mae-Soon; Choi, Sung-Jin; Kim, Jin-Soo; et al, IEEE ELECTRON DEVICE LETTERS, v.29, no.7, pp.781 - 783, 2008-07 |
Resistive-Memory Embedded Unified RAM (R-URAM) Kim, Sung-Ho; Choi, Sung-Jin; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.56, no.11, pp.2670 - 2674, 2009-11 |
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