Browse "School of Electrical Engineering(전기및전자공학부)" by Subject reuse
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| Accelerating verification with reusable testbench Son, J; Choi, HaeWook; Park, Sin Chong, IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, v.E89D, pp.853 - 856, 2006-02 |
| Writing to dirty flash memory = 멀티레벨 플래쉬 메모리 재사용에 관한 이론적 한계link Kim, Min-Gyu; 김민규; et al, 한국과학기술원, 2009 |
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