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Effect of Annealing Temperature on Minimum Domain Size of Ferroelectric Hafnia Yun, Seokjung; Kim, Hoon; Seo, Myungsoo; Kang, Min-Ho; Kim, Taeho; Cho, Seongwoo; Park, Ming Hyuk; et al, ACS APPLIED ELECTRONIC MATERIALS, v.6, no.4, pp.2134 - 2141, 2024-03 |
Effect of rapid thermal annealing on the interface trap density between Pt and (Ba,Sr)TiO3 thin film Kwak, DH; Jang, BT; Cha, SY; Lee, JS; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.17, no.1-4, pp.179 - 186, 1997 |
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