Browse "School of Electrical Engineering(전기및전자공학부)" by Subject probe

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Picosecond time-domain characterization of CPW bends using a photoconductive near-field mapping probe

Lee, J; Kim, J; Yu, S; Kim, Joungho, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.11, no.11, pp.453 - 455, 2001-11

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