Browse "School of Electrical Engineering(전기및전자공학부)" by Subject current reconstruction▼aembedded current probing structures▼aeye diagram reconstruction▼amagnetic coupling▼amemory test▼apower integrity▼asignal integrity▼asimultaneous switching current▼atest interposer
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| Non-invasive measurement and reconstruction methods for high-speed integrated IC and package = 고속 집적회로와 패키지 테스트를 위한 비파괴성 측정 및 신호 복원 기법link Kim, Jonghoon; Kim, Joungho; et al, 한국과학기술원, 2017 |
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