Browse "School of Electrical Engineering(전기및전자공학부)" by Subject Total ionizing dose
Showing results 1 to 2 of 2
| Radiation-hardened gate-around n-MOSFET structure for radiation-tolerant application-specific integrated circuits Lee, Min Su; Lee, Hee Chul, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.61, no.10, pp.1670 - 1674, 2012-11 |
| TID Effect Test of the ICS307GI-03LF Serially Programmable Clock Source for Space Applications Shin, Goo-Hwan; Ryu, Kwang-Sun; Myung, Noh-Hoon; Kim, Ee-Eul, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.59, pp.670 - 673, 2011-08 |
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