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Discharge Current Analysis Estimating the Defect Sites in Amorphous Hafnia Thin-Film Transistor Goh, Youngin; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.8, pp.3264 - 3268, 2018-08 |
TFT Channel Materials for Display Applications: From Amorphous Silicon to Transition Metal Dichalcogenides Shim, Gi Woong; Hong, Woonggi; Cha, Jun-Hwe; Park, Jung Hwan; Lee, Keon Jae; Choi, Sung-Yool, ADVANCED MATERIALS, v.32, no.35, pp.1907133, 2020-09 |
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