Browse "School of Electrical Engineering(전기및전자공학부)" by Author Na, S
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| TEM investigation of Ytterbium silicide formation process for Schottky contact applications Na, S; Choi, J; Choi, H; Seo, Y; Kim, H; Lee, Seok-Hee; Lee, HJ, International union of microbeam analysis societies and International Symposium on atomic level characterization for new materials and devices, Korean Society of Microscopy, 2011-05 |
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