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Analysis of TSV-to-TSV coupling with high-impedance termination in 3D ICs Song, T; Liu, C; Kim, DH; Lim, SK; Cho, J; Kim, J; Pak, JS; et al, 12th International Symposium on Quality Electronic Design, ISQED 2011, pp.122 - 128, ISQED 2011, 2011-03-14 |
Effects of Carrier-Velocity Saturation in the LDD Region on the Characteristics of Short Chanel LDD MOSFET Hong, Songcheol; Lee, M; Lee, J; Kang, K; Yoon, K, ISDRS, pp.477 - 480, 1991 |
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