Browse "School of Electrical Engineering(전기및전자공학부)" by Author Wakana, S.
Showing results 1 to 5 of 5
| 120-G Hz-Bandwidth Characterization of Microwave Passive Devices Using External Silicon-On-Sapphire Photoconductive Sampling Probe Kim, Joungho; Son, J.; Wakana, S.; Whitaker, J., Ultrafast Electronics and Optoelectronics, pp.224 - 227, 1993 |
| A Novel Free-Standing Absolute-Voltage Probe with 2.3 ps Resolution and 1-Microvolt Sensitivity Kim, Joungho; Williamson, S.; Nees, J.; Wakana, S., 8th International Conference on Ultrafast Phenomena, pp.496 - 496, 1992 |
| Novel free-standing absolute-voltage probe with 2.3-picosecond resolution and 1-microvolt sensitivity( book) Kim, Joungho; Williamson, S.; Nees, J.; Wakana, S., SPRINGER SERIES IN CHEMICAL PHYSICS, v.0, no.55, pp.496 - 499, 1992-06 |
| Novel High-impedance photoconductive sampling probe for ultra-high speed circuit characterization Kim, Joungho; Chan, Y. J.; Williamson, S.; Nees, J.; Wakana, S.; Whitaker, J.; Pavlidis, D., Technical Digest of 1992 IEEE GaAs IC Symposium, pp.19 - 22, 1992 |
| Time-domain Network Analysis of MM-wave Circuits Based on a Photoconductive Probe Sampling technique Kim, Joungho; Son, J.; Wakana, S.; Nees, J.; Williamson, S.; Whitaker, J.; Kwon, Y.; et al, 1993 IEEE MTT-s Digest, pp.1359 - 1362, 1993 |
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