Browse "School of Electrical Engineering(전기및전자공학부)" by Author Il Kim
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| High-speed Probe Card Design to Reduce the Crosstalk Noise for Wafer-level Test Kim, Joung-Ho; Lee, Eunjung; Lee, Manho; Kim, Jonghoon J.; Kim, Mijoo; Kim, Jonghoon; Park,JK; et al, 23rd Conference on Electrical Performance of Electronic Packaging and Systems(EPEPS2014), 23rd Conference on Electrical Performance of Electronic Packaging and Systems(EPEPS2014), 2014-11-01 |
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