Showing results 1 to 2 of 2
Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs Park, Jun-Young; Moon, Dong-Il; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.3, pp.777 - 788, 2020-03 |
On the Self-Recovery Phenomenon for a Cylindrical Rigid Body Rotating in an Incompressible Viscous Fluid Chang, Dong Eui; Jeon, Soo, JOURNAL OF DYNAMIC SYSTEMS MEASUREMENT AND CONTROL-TRANSACTIONS OF THE ASME, v.137, no.2, 2015-02 |
Discover