Browse "School of Electrical Engineering(전기및전자공학부)" by Subject punchthrough
Showing results 1 to 2 of 2
| Demonstration of a Curable Nanowire FinFET Using Punchthrough Current to Repair Hot-Carrier Damage Park, Jun-Young; Hur, Jae; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.39, no.2, pp.180 - 183, 2018-02 |
| Extremely scaled 3-dimensional multiple-gate technologies for terabit era Choi, Yang-Kyu; Kim, Kuk-Hwan; Han, Jin-Woo; Ryu, Seong-Wan; Lee, Hyunjin, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.7, no.11, pp.4126 - 4130, 2007-11 |
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