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Bipolar resistance switching driven by tunnel barrier modulation in TiOx/AlOx bilayered structure Baik, Seung Jae; Lim, Koeng Su, APPLIED PHYSICS LETTERS, v.97, no.7, pp.072109, 2010-08 |
HfO2/HfOxNy/HfO2 Gate Dielectric Fabricated by In Situ Oxidation of Plasma-Enhanced Atomic Layer Deposition HfN Middle Layer Maeng, W. J.; Gu, Gil Ho; Park, C. G.; Lee, Kayoung; Lee, Taeyoon; Kim, Hyungjun, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.156, no.8, pp.G109 - G113, 2009 |
Physical Observation of a Thermo-Morphic Transition in a Silicon Nanowire Choi, Sung-Jin; Moon, Dong-Il; Duarte, Juan P.; Ahn, Jae-Hyuk; Choi, Yang-Kyu, ACS NANO, v.6, no.3, pp.2378 - 2384, 2012-03 |
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