Browse "School of Electrical Engineering(전기및전자공학부)" by Subject mask perturbation

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Robust Perturbation for Visual Explanation: Cross-checking Mask Optimization to Avoid Class Distortion

Kim, Junho; Kim, Seongyeop; Kim, Seong Tae; Ro, Yong Man, IEEE TRANSACTIONS ON IMAGE PROCESSING, v.31, pp.301 - 313, 2022-01

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