Browse "School of Electrical Engineering(전기및전자공학부)" by Subject interface state density (N-it)
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| Verification of Interface State Properties of a-InGaZnO Thin-Film Transistors With Sin(x) and SiO2 Gate Dielectrics by Low-Frequency Noise Measurements Choi, Hyun-Sik; Jeon, Sanghun; Kim, Hojung; Shin, Jaikwang; Kim, Changjung; Chung, U-In, IEEE ELECTRON DEVICE LETTERS, v.32, no.8, pp.1083 - 1085, 2011-08 |
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