Browse "School of Electrical Engineering(전기및전자공학부)" by Subject gate-all-around
Showing results 1 to 3 of 3
| Electro-Thermal Erasing at 10(4)-Fold Faster Speeds in Charge-Trap Flash Memory Kim, Myung-Su; Ahn, Dae-Chul; Park, Jun-Young; Seo, Myungsoo; Kim, Seong-Yeon; Kim, Wu-Kang; Yun, Dae-Hwan; et al, IEEE ELECTRON DEVICE LETTERS, v.40, no.2, pp.196 - 199, 2019-02 |
| Low-Frequency Noise Characteristics in SONOS Flash Memory with Vertically Stacked Nanowire FETs = 수직 적층 나노와이어 트렌지스터 기반 비휘발성 플래시 메모리에서의 저주파 잡음 특성 분석link Bang, Tewook; Choi, Yang-Kyu; et al, 한국과학기술원, 2017 |
| Silicon Nanowire All-Around Gate MOSFETs Built on a Bulk Substrate by All Plasma-Etching Routes Moon, Dong-Il; Choi, Sung-Jin; Kim, Chung-Jin; Kim, Jee-Yeon; Lee, Jin-Seong; Oh, Jae-Sub; Lee, Gi-Sung; et al, IEEE ELECTRON DEVICE LETTERS, v.32, no.4, pp.452 - 454, 2011-04 |
Discover
Open Access
- 573 OA Article
Date issued
- 4,935 2020 - 2024
- 18,938 2010 - 2019
- 15,019 2000 - 2009
- 7,644 1990 - 1999
- 2,391 1980 - 1989