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Transient charge trapping and detrapping properties of a thick SiO2/Al2O3 stack studied by short single pulse I-d-V-g Chang, Man; Jo, Minseok; Jung, Seungjae; Lee, Joonmyoung; Jeon, Sanghun; Hwang, Hyunsang, APPLIED PHYSICS LETTERS, v.94, no.26, 2009-06 |
Wide memory window in graphene oxide charge storage nodes Wang, Shuai; Pu, Jing; Chan, Daniel S. H.; Cho, Byung Jin; Loh, Kian Ping, APPLIED PHYSICS LETTERS, v.96, no.14, 2010-04 |
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