Browse "School of Electrical Engineering(전기및전자공학부)" by Subject RANDOM TELEGRAPH NOISE
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| Conduction and Low-Frequency Noise Analysis in Al/alpha-TiOX/Al Bipolar Switching Resistance Random Access Memory Devices Lee, Jung-Kyu; Jeong, Hu Young; Cho, In-Tak; Lee, JeongYong; Choi, Sung-Yool; Kwon, Hyuck-In; Lee, Jong-Ho, IEEE ELECTRON DEVICE LETTERS, v.31, no.6, pp.603 - 605, 2010-06 |
| Dynamic Error Recovery Flow Prediction Based on Reusable Machine Learning for Low Latency NAND Flash Memory under Process Variation Hwang, Minyoung; Jee, Jeongju; Kang, Joonhyuk; Park, Hyuncheol; Lee, Seonmin; Kim, Jinyoung, IEEE ACCESS, v.10, pp.117715 - 117731, 2022-11 |
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