Browse "School of Electrical Engineering(전기및전자공학부)" by Subject OXIDE-UNGROWTH PHENOMENON
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| Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFETs with recessed LOCOS isolation structure Yue, JMP; Chim, WK; Cho, Byung Jin; Chan, DSH; Qin, WH; Kim, YB; Jang, SA; et al, IEEE ELECTRON DEVICE LETTERS, v.21, no.3, pp.130 - 132, 2000-03 |
| Isolation process induced wafer warpage Jang, SA; Yeo, IS; Kim, YB; Cho, Byung Jin; Lee, SK, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.1, no.1, pp.46 - 48, 1998-07 |
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