Browse "School of Electrical Engineering(전기및전자공학부)" by Subject Memory device
Showing results 1 to 2 of 2
| Analysis of Fluorine Effects on Charge-Trap Flash Memory of W/TiN/Al2O3/Si3N4/SiO2/Poly-Si Gate Stack Lee, Tae Yoon; Lee, Seung Hwan; Son, Jun Woo; Lee, Sang Jae; Bong, Jae Hoon; Shin, Eui Joong; Kim, Sung Ho; et al, SOLID-STATE ELECTRONICS, v.164, pp.107713, 2020-02 |
| Critical role of top interface layer on the bipolar resistive switching of Al/PEDOT:PSS/Al memory device Kim, Jong Yun; Jeong, Hu Young; Kim, Jeong Won; Yoon, Tae Hyun; Choi, Sung-Yool, CURRENT APPLIED PHYSICS, v.11, no.2, pp.35 - 39, 2011-03 |
Discover
Open Access
- 573 OA Article
Date issued
- 5,421 2020 - 2024
- 18,944 2010 - 2019
- 15,019 2000 - 2009
- 7,644 1990 - 1999
- 2,391 1980 - 1989