Browse "School of Electrical Engineering(전기및전자공학부)" by Subject LOCOS
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| Anomalous field-oxide-ungrowth phenomenon in recessed local oxidation of silicon isolation structure Cho, Byung Jin; Jang, S.-A.; Kim, Y.-B.; Lee, D.-D.; Kim, J.-C., JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.144, no.1, pp.320 - 326, 1997-01 |
| Hot-carrier lifetime dependence on channel width and silicon recess depth in N-channel metal-oxide-semiconductor field-effect-transistors with the recessed local oxidation of silicon isolation structure Chim, WK; Cho, Byung Jin; Yue, JMP, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.1, pp.47 - 53, 2002-01 |
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