Browse "School of Electrical Engineering(전기및전자공학부)" by Subject INTERFACE-TRAP DENSITY

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A Novel Charge Pumping Technique With Gate-Induced Drain Leakage Current

Lee, Geon-Beom; Kim, Jeong-Yeon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.44, no.5, pp.709 - 712, 2023-05

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