Browse "School of Electrical Engineering(전기및전자공학부)" by Author Shin, D.
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| A stopping criterion for low-density parity-check codes Shin, D.; Heo, K.; Oh, S.; Ha, Jeongseok, 2007 IEEE 65th Vehicular Technology Conference - VTC2007-Spring, pp.1529 - 1533, 2007-04-22 |
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