Showing results 1 to 7 of 7
A comprehensive modeling of dynamic negative-bias temperature instability in PMOS body-tied FinFETs Lee, H; Lee, CH; Park, D; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.27, no.4, pp.281 - 283, 2006-04 |
Gate oxide damage from high dose implantation of hydrogen Choi, Yang-Kyu; Yun, C; Park, D; Cheung, N, the 13th International Conference on Ion Implantation Technology, 2000-09 |
Hot carrier reliability study in body-tied fin-type field effect transistors Han, JW; Lee, CH; Park, D; Choi, Yang-Kyu, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.4B, pp.3101 - 3105, 2006-04 |
Low-complexity frequency-offset insensitive detection for orthogonal modulation Park, S; Park, D; Park, H; Lee, Kwyro, ELECTRONICS LETTERS, v.41, pp.1226 - 1228, 2005-10 |
NEMS switch with 30 nm-thick beam and 20 nm-thick air-gap for high density non-volatile memory applications Jang, WW; Yoon, Jun-Bo; Kim, MS; Lee, JM; Kim, SM; Yoon, EJ; Cho, KH; et al, SOLID-STATE ELECTRONICS, v.52, no.10, pp.1578 - 1583, 2008-10 |
Parasitic S/D resistance effects on hot-carrier reliability in body-tied FinFETs Han, JW; Lee, CH; Park, D; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.27, no.6, pp.514 - 516, 2006-06 |
Phase development of radio-frequency magnetron sputter-deposited Pb(Mg1/3Nb2/3)O-3-PbTiO3 (90/10) thin films Lee, JK; Park, D; Cheong, DS; Park, JW; Park, CS, JOURNAL OF VACUUM SCIENCE TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.18, no.4, pp.1659 - 1662, 2000-04 |
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