Browse "School of Electrical Engineering(전기및전자공학부)" by Author Kim, Sungjoon

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Simulation and ground test for the total ionizing dose effects of STSAT-2

Ryu, Kwangsun; Shin, Goo-Hwan; Kim, Hyung-Myung; Kim, Sungjoon; Ko, Dai-Ho; Kim, Heejun; Min, KyoungWook, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.50, no.5, pp.1552 - 1556, 2007-05

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