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Physical Reservoir based on a Leaky-FeFET Using the Temporal Memory Effect Lee, Gyusoup; Kang, Changyeon; Kim, Seongho; Park, Youngkeun; Shin, Eui Joong; Cho, Byung-Jin, IEEE ELECTRON DEVICE LETTERS, v.45, no.1, pp.108 - 111, 2024-01 |
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